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Uncertainty in Photoconductance Measurements of the Emitter Saturation Current

Date

Authors

Thomson, Andrew

Hamieri, Ziv

Grant, Nicholas

Price, Chris J.

Yan, Di

Spurgin, Jack

Publisher

IEEE Electron Devices Society

Abstract

We determine uncertainty in photoconductance (PC) measurements of the emitter saturation current density (J 0e). A Monte Carlo method is used to calculate the impact of uncertainty from the input parameters including the test equipment calibration, the in

Keywords

Keywords: Emitter saturation current density; Emitter saturation currents; Generation uncertainty; Measured voltages; Photovoltaics; Quasi-steady state; recombination; Transient measurement; Equipment testing; Monte Carlo methods; Silicon; Silicon wafers; Uncertain Photovoltaics; recombination; silicon

URI

http://hdl.handle.net/1885/29583

Collections

ANU Research Publications

Source

IEEE Journal of Photovoltaics

Type

Journal article

DOI

10.1109/JPHOTOV.2013.2270346

Restricted until

2037-12-31

Downloads

File

Description

01_Thomson_Uncertainty_in_2013.pdf (1 MB)

02_Thomson_Uncertainty_in_2013.pdf (1.02 MB)

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