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Resistive switching memories in MoS2 nanosphere assemblies

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Authors

Xu, Xiao-Yong
Yin, Zongyou
Xu, Chun-Xiang
Dai, Jun
Hu, Jing-Guo

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American Institute of Physics (AIP)

Abstract

A resistive switching memory device consisting of reduced graphene oxide and indium tin oxide as top/bottom two electrodes, separated by dielectric MoS2 nanosphere assemblies as the active interlayer, was fabricated. This device exhibits the rewritable nonvolatile resistive switching with low SET/RESET voltage (∼2 V), high ON/OFF resistance ratio (∼10 4), and superior electrical bistability, introducing a potential application in data storage field. The resistance switching mechanism was analyzed in the assumptive model of the electron tunneling across the polarized potential barriers

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Source

Applied Physics Letters

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Open Access

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Restricted until

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