Resistive switching memories in MoS2 nanosphere assemblies
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Xu, Xiao-Yong
Yin, Zongyou
Xu, Chun-Xiang
Dai, Jun
Hu, Jing-Guo
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American Institute of Physics (AIP)
Abstract
A resistive switching memory device consisting of reduced graphene oxide and indium tin oxide as top/bottom two electrodes, separated by dielectric MoS2 nanosphere assemblies as the active interlayer, was fabricated. This device exhibits the rewritable nonvolatile resistive switching with low SET/RESET voltage (∼2 V), high ON/OFF resistance ratio (∼10 4), and superior electrical bistability, introducing a potential application in data storage field. The resistance switching mechanism was analyzed in the assumptive model of the electron tunneling across the polarized potential barriers
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Applied Physics Letters
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Open Access