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Effective Lifetime Characterisation of a Room Temperature Meta-Stable Defect in N-Type 5 ΩCM FZ Phosphorus-Diffused Oxide-Passivated Silicon

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dc.contributor.authorThomson, Andrew
dc.contributor.authorMcIntosh, Keith
dc.contributor.authorMacDonald, Daniel
dc.coverage.spatialValencia Spain
dc.date.accessioned2015-12-08T22:09:19Z
dc.date.createdSeptember 1-4 2008
dc.date.issued2008
dc.date.updated2015-12-08T07:23:55Z
dc.identifier.urihttp://hdl.handle.net/1885/28976
dc.publisherConference Organising Committee
dc.relation.ispartofseriesEuropean Photovoltaic Solar Energy Conference 2008
dc.sourceProceedings of the European Photovoltaic Solar Energy Conference 2008
dc.titleEffective Lifetime Characterisation of a Room Temperature Meta-Stable Defect in N-Type 5 ΩCM FZ Phosphorus-Diffused Oxide-Passivated Silicon
dc.typeConference paper
local.bibliographicCitation.lastpage521
local.bibliographicCitation.startpage517
local.contributor.affiliationThomson, Andrew, College of Engineering and Computer Science, ANU
local.contributor.affiliationMcIntosh, Keith, College of Engineering and Computer Science, ANU
local.contributor.affiliationMacDonald, Daniel, College of Engineering and Computer Science, ANU
local.contributor.authoruidThomson, Andrew, u4323527
local.contributor.authoruidMcIntosh, Keith, u4249405
local.contributor.authoruidMacDonald, Daniel, u9718154
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor090699 - Electrical and Electronic Engineering not elsewhere classified
local.identifier.ariespublicationu9606031xPUB61
local.type.statusPublished Version

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