Schottky-Barrier-Induced Asymmetry in the Negative-Differential-Resistance Response of Nb/NbOx/Pt Cross-Point Devices
| dc.contributor.author | Nath, Shimul Kanti | |
| dc.contributor.author | Nandi, Sanjoy | |
| dc.contributor.author | El-Helou, Assaad E. | |
| dc.contributor.author | Liu, Xinjun | |
| dc.contributor.author | Li, Shuai | |
| dc.contributor.author | Ratcliff, Tom | |
| dc.contributor.author | Raad, Peter | |
| dc.contributor.author | Elliman, Robert | |
| dc.date.accessioned | 2022-02-16T04:17:02Z | |
| dc.date.available | 2022-02-16T04:17:02Z | |
| dc.date.issued | 2020 | |
| dc.date.updated | 2020-12-13T07:27:32Z | |
| dc.description.abstract | The negative differential resistance (NDR) response of Nb/NbOx/Pt cross-point devices is shown to have a polarity dependence due to the effect of the metal/oxide Schottky barriers on the contact resistance. Three distinct responses are observed under opposite polarity testing: bipolar S-type NDR, bipolar snap-back NDR, and combined S-type and snap-back NDR, depending on the stoichiometry of the oxide film and device area. In-situ thermoreflectance imaging is used to show that these NDR responses are associated with strong current localisation, thereby justifying the use of a previously developed two-zone, core shell thermal model of the device. The observed polarity dependent NDR responses, and their dependence on stoichiometry and area, are then explained by extending this model to include the effect of the polarity dependent contact resistance. This study provides an improved understanding of the NDR response of metal/oxide/metal structures and informs the engineering of devices for neuromorphic computing and non-volatile memory applications. | en_AU |
| dc.description.sponsorship | This work is partly funded by an Australian Research Council (ARC) Linkage Project (LP150100693) and Varian Semiconductor Equipment/Applied Materials | en_AU |
| dc.format.mimetype | application/pdf | en_AU |
| dc.identifier.issn | 2331-7019 | en_AU |
| dc.identifier.uri | http://hdl.handle.net/1885/261203 | |
| dc.language.iso | en_AU | en_AU |
| dc.provenance | https://v2.sherpa.ac.uk/id/publication/31470..."The Published Version can be archived in a Non-Commercial Institutional Repository" from SHERPA/RoMEO site (as at 16/02/2022) | en_AU |
| dc.publisher | American Physical Society | en_AU |
| dc.relation | http://purl.org/au-research/grants/arc/LP150100693 | en_AU |
| dc.rights | © 2020 American Physical Society | en_AU |
| dc.source | Physical Review Applied | en_AU |
| dc.title | Schottky-Barrier-Induced Asymmetry in the Negative-Differential-Resistance Response of Nb/NbOx/Pt Cross-Point Devices | en_AU |
| dc.type | Journal article | en_AU |
| dcterms.accessRights | Open Access | en_AU |
| local.bibliographicCitation.issue | 6 | en_AU |
| local.bibliographicCitation.lastpage | 10 | en_AU |
| local.bibliographicCitation.startpage | 1 | en_AU |
| local.contributor.affiliation | Nath, Shimul, College of Science, ANU | en_AU |
| local.contributor.affiliation | Nandi, Sanjoy, College of Science, ANU | en_AU |
| local.contributor.affiliation | El-Helou, Assaad E., Southern Methodist University | en_AU |
| local.contributor.affiliation | Liu, Xinjun, Tianjin University | en_AU |
| local.contributor.affiliation | Li, Shuai, College of Science, ANU | en_AU |
| local.contributor.affiliation | Ratcliff, Tom, College of Engineering and Computer Science, ANU | en_AU |
| local.contributor.affiliation | Raad, Peter, Department of Mechanical Engineering, Southern Methodist University | en_AU |
| local.contributor.affiliation | Elliman, Rob, College of Science, ANU | en_AU |
| local.contributor.authoruid | Nath, Shimul, u5482854 | en_AU |
| local.contributor.authoruid | Nandi, Sanjoy, u4939839 | en_AU |
| local.contributor.authoruid | Li, Shuai, u4748327 | en_AU |
| local.contributor.authoruid | Ratcliff, Tom, u4311306 | en_AU |
| local.contributor.authoruid | Elliman, Rob, u9012877 | en_AU |
| local.description.notes | Imported from ARIES | en_AU |
| local.identifier.absfor | 090604 - Microelectronics and Integrated Circuits | en_AU |
| local.identifier.absfor | 020404 - Electronic and Magnetic Properties of Condensed Matter; Superconductivity | en_AU |
| local.identifier.absseo | 970102 - Expanding Knowledge in the Physical Sciences | en_AU |
| local.identifier.absseo | 970109 - Expanding Knowledge in Engineering | en_AU |
| local.identifier.absseo | 970110 - Expanding Knowledge in Technology | en_AU |
| local.identifier.ariespublication | U4474173xPUB64 | en_AU |
| local.identifier.citationvolume | 13 | en_AU |
| local.identifier.doi | 10.1103/PhysRevApplied.13.064024 | en_AU |
| local.publisher.url | https://journals.aps.org/prapplied/ | en_AU |
| local.type.status | Published Version | en_AU |
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