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Track Formation and Surface Evolution in Indium Phosphide Irradiated by Swift Heavy Ions

Date

Authors

Khalil, Ali S

Chadderton, Lewis

Stewart, Andrew

Ridgway, Mark C

Llewellyn, David

Byrne, Aidan

Publisher

Pergamon-Elsevier Ltd

Abstract

Transmission electron microscopy (TEM) and atomic force microscopy (AFM) have been used to study radiation effects in 200 MeV Au ion-irradiated InP single crystals. The observations reveal the presence of individual tracks of intermittent nature about 10

Keywords

Keywords: Amorphization; Amorphous materials; Atomic force microscopy; Heavy ions; Irradiation; Radiation effects; Single crystals; Surface roughness; Transmission electron microscopy; Ion irradiation; Track cores; Track formation; Semiconducting indium phosphide

URI

http://hdl.handle.net/1885/81241

Collections

ANU Research Publications

Source

Radiation Measurements

Type

Journal article

DOI

10.1016/j.radmeas.2005.05.018

Restricted until

2037-12-31

Downloads

File

Description

01_Khalil_Track_Formation_and_Surface_2005.pdf (424.16 KB)