Characterization of dielectric layer, laser damage and edge recombination in miniature silicon solar cells
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Zin, Ngwe Soe
Blakers, Andrew
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Institute of Electrical and Electronics Engineers (IEEE Inc)
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Miniature silicon solar cells (8 × 2.0 mm2) are being fabricated for use in tandem-cell concentrator systems. Several factors combine to make the achievement of high efficiency problematical. These include surface, bulk and edge recombination. The latter
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Proceedings of PVSC 2010
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2037-12-31
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