Using Bayesian Analysis and Gaussian Processes to Infer Electron Temperature and Density Profiles on the MAST Experiment

Abstract

A unified, Bayesian inference of midplane electron temperature and density profiles using both Thompson scattering (TS) and interferometric data is presented. Beyond the Bayesian nature of the analysis, novel features of the inference are the use of a Gaussian process prior to infer a mollification length-scale of inferred profiles and the use of Gauss-Laguerre quadratures to directly calculate the depolarisation term associated with the TS forward model. Results are presented from an application of the method to data from the high resolution TS system on the Mega-Ampere Spherical Tokamak, along with a comparison to profiles coming from the standard analysis carried out on that system.