Efficient point defect engineered si light-emitting diode at 1.218 μm

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Authors

Bao, Jiming
Tabbal, Malek
Kim, Taegon
Charnvanichborikarn, Supakit
Williams, James
Aziz, Michael
Capasso, Federico

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Optical Society of America

Abstract

We have demonstrated a Si LED with an internal quantum efficiency ∼ 10 % using a novel approach to enhance light emission based on point defect engineering, which uses state-of-the art technology.

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Citation

Source

CLEO/QELS 07 Technical Digest CD-ROM

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