Orientation dependence of swift heavy ion track formation in potassium titanyl phosphate
| dc.contributor.author | Ma, Yu-Jie | |
| dc.contributor.author | Mota Santiago, Pablo | |
| dc.contributor.author | Rodriguez, Matias D. | |
| dc.contributor.author | Kremer, Felipe | |
| dc.contributor.author | Schauries, Daniel | |
| dc.contributor.author | Afra, Boshra | |
| dc.contributor.author | Bierschenk, Thomas | |
| dc.contributor.author | Llewellyn, David J. | |
| dc.contributor.author | Lu, Fei | |
| dc.contributor.author | Ridgway, Mark C. | |
| dc.contributor.author | Kluth, Patrick | |
| dc.date.accessioned | 2016-09-15T06:37:00Z | |
| dc.date.available | 2016-09-15T06:37:00Z | |
| dc.date.issued | 2016 | |
| dc.description.abstract | Potassium titanyl phosphate crystals in both x-cut and z-cut were irradiated with 185 MeV Au ions. The morphology of the resulting ion tracks was investigated using small angle x-ray scattering (SAXS), transmission electron microscopy (TEM), and atomic force microscopy (AFM). SAXS measurements indicate the presence of cylindrical ion tracks with abrupt boundaries and a density contrast of 1 ± 0.5% compared to the surrounding matrix, consistent with amorphous tracks. The track radius depends on the crystalline orientation, with 6.0 ± 0.1 nm measured for ion tracks along the x-axis and 6.3 ± 0.1 nm for those along the z-axis. TEM images in both cross-section and plan-view show amorphous ion tracks with radii comparable to those determined from SAXS analysis. The protruding hillocks covering the sample surface detected by AFM are consistent with a lower density of the amorphous material within the ion tracks compared to the surrounding matrix. Simulations using an inelastic thermal-spike model indicate that differences in the thermal conductivity along the z- and x-axis can partially explain the different track radii along these directions. | en_AU |
| dc.description.sponsorship | The authors acknowledge the National Nature Science Foundation of China (Grant No. 51272135) and the Australian Research Council for financial support and thank the staff of the ANU Heavy Ion Accelerator Facility for technical support. Part of this research was undertaken on the SAXS/WAXS beamline at the Australian Synchrotron, Victoria, Australia. | en_AU |
| dc.identifier.issn | 0884-2914 | en_AU |
| dc.identifier.uri | http://hdl.handle.net/1885/108892 | |
| dc.provenance | http://www.sherpa.ac.uk/romeo/issn/0884-2914/..."Author's post-print on departmental website, institutional repository, non-commercial subject-based repositories, such as PubMed Central, Europe PMC or arXiv, after a 6 months embargo" from SHERPA/RoMEO site (as at 13/10/16). | |
| dc.publisher | Cambridge University Press | en_AU |
| dc.rights | © 2016 Materials Research Society | en_AU |
| dc.source | Journal of Materials Research | en_AU |
| dc.title | Orientation dependence of swift heavy ion track formation in potassium titanyl phosphate | en_AU |
| dc.type | Journal article | en_AU |
| dcterms.accessRights | Open Access | |
| local.bibliographicCitation.issue | 15 | en_AU |
| local.bibliographicCitation.lastpage | 2336 | en_AU |
| local.bibliographicCitation.startpage | 2329 | en_AU |
| local.contributor.affiliation | Ma, Yu-Jie, Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Mota Santiago, P., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Rodriguez, M. D., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Kremer, F., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Schauries, D., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Afra, B., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Bierschenk, T., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Llewellyn, D. J., Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Ridgway, M. C., Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Kluth, P., Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.authoruid | u5389782 | en_AU |
| local.contributor.authoruid | u5438078 | en_AU |
| local.contributor.authoruid | u4054452 | en_AU |
| local.identifier.citationvolume | 31 | en_AU |
| local.identifier.doi | 10.1557/jmr.2016.184 | en_AU |
| local.publisher.url | http://www.cambridge.org/uk/ | en_AU |
| local.type.status | Accepted Version | en_AU |