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The influence of corona charging on the Si/Si02 interface

dc.contributor.authorZhang, Chun
dc.contributor.authorJin, Hao
dc.contributor.authorJellett, Wendy
dc.contributor.authorWeber, Klaus
dc.coverage.spatialValencia Spain
dc.date.accessioned2015-12-08T22:22:18Z
dc.date.createdSeptember 1-4 2008
dc.date.issued2008
dc.date.updated2015-12-08T08:43:17Z
dc.identifier.urihttp://hdl.handle.net/1885/32513
dc.publisherConference Organising Committee
dc.relation.ispartofseriesEuropean Photovoltaic Solar Energy Conference 2008
dc.sourceProceedings of the European Photovoltaic Solar Energy Conference 2008
dc.titleThe influence of corona charging on the Si/Si02 interface
dc.typeConference paper
local.bibliographicCitation.lastpage264
local.bibliographicCitation.startpage261
local.contributor.affiliationZhang, Chun, College of Engineering and Computer Science, ANU
local.contributor.affiliationJin, Hao, College of Engineering and Computer Science, ANU
local.contributor.affiliationJellett, Wendy, College of Engineering and Computer Science, ANU
local.contributor.affiliationWeber, Klaus, College of Engineering and Computer Science, ANU
local.contributor.authoruidZhang, Chun, u4386278
local.contributor.authoruidJin, Hao, u4065013
local.contributor.authoruidJellett, Wendy, u4087286
local.contributor.authoruidWeber, Klaus, u9116880
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor090699 - Electrical and Electronic Engineering not elsewhere classified
local.identifier.ariespublicationu9606031xPUB92
local.type.statusPublished Version

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