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Modelling of slow transient processes in organo-metal halide perovskites

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dc.contributor.authorJacobs, Daniel
dc.contributor.authorFu, Xiao
dc.contributor.authorWeber, Klaus
dc.contributor.authorCatchpole, Kylie
dc.contributor.authorWhite, Thomas
dc.contributor.editorde Sterke M.
dc.contributor.editorPoulton C.
dc.contributor.editorPiprek J.
dc.contributor.editorSteel M.
dc.coverage.spatialSydney; Australia
dc.date.accessioned2019-11-28T03:44:24Z
dc.date.createdJuly 11-15 2016
dc.date.issued2016
dc.date.updated2019-06-09T08:16:25Z
dc.description.abstractAbstract: We have modelled the effect of ionic motion in MAPbI3 cells, deepening the uuderstanding of how these mobile species can result in current-voltage hysteresis. In addition, we present a quantitative model for photo-deactivation of carrier traps to explain the observed increase in photoluminesence efficiency upon light-soaking
dc.format.mimetypeapplication/pdfen_AU
dc.identifier.isbn9781467386036en_AU
dc.identifier.urihttp://hdl.handle.net/1885/186935
dc.language.isoen_AUen_AU
dc.publisherIEEEen_AU
dc.relation.ispartofseriesInternational Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016
dc.rights©2016 IEEEen_AU
dc.source16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016en_AU
dc.source.urihttp://www.nusod.org/2016/conf_author.htmlen_AU
dc.titleModelling of slow transient processes in organo-metal halide perovskitesen_AU
dc.typeConference paperen_AU
local.bibliographicCitation.lastpage186en_AU
local.bibliographicCitation.startpage185en_AU
local.contributor.affiliationJacobs, Daniel, College of Science, ANUen_AU
local.contributor.affiliationFu, Xiao, College of Engineering and Computer Science, ANUen_AU
local.contributor.affiliationWeber, Klaus, College of Engineering and Computer Science, ANUen_AU
local.contributor.affiliationCatchpole, Kylie, College of Engineering and Computer Science, ANUen_AU
local.contributor.affiliationWhite, Thomas, College of Engineering and Computer Science, ANUen_AU
local.contributor.authoruidJacobs, Daniel, u5128830en_AU
local.contributor.authoruidFu, Xiao, u5510995en_AU
local.contributor.authoruidWeber, Klaus, u9116880en_AU
local.contributor.authoruidCatchpole, Kylie, u9612096en_AU
local.contributor.authoruidWhite, Thomas, u4835361en_AU
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor090600 - ELECTRICAL AND ELECTRONIC ENGINEERINGen_AU
local.identifier.ariespublicationU3488905xPUB25301en_AU
local.identifier.doi10.1109/NUSOD.2016.7547096en_AU
local.identifier.scopusID2-s2.0-84987601011
local.publisher.urlhttps://ieeexplore.ieee.org/en_AU
local.type.statusPublished Versionen_AU

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