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The Emergence of New Ion Tract Applications

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dc.contributor.authorFink, Dietmar
dc.contributor.authorAlegaonkar, P S
dc.contributor.authorPetrov, A V
dc.contributor.authorBerdinsky, A.S.
dc.contributor.authorRao, V.
dc.contributor.authorMuller, M
dc.contributor.authorDwivedi, K.K.
dc.contributor.authorChadderton, Lewis
dc.date.accessioned2015-12-13T23:09:43Z
dc.date.available2015-12-13T23:09:43Z
dc.date.issued2003
dc.date.updated2015-12-12T08:20:23Z
dc.description.abstractThe recent years have brought a renaissance of interest in ion tracks, for the sake of novel applications. This paper summarizes some of the newly emerging possibilities, and the strategies that have been initiated. Only a few applications that are based
dc.identifier.issn1350-4487
dc.identifier.urihttp://hdl.handle.net/1885/87125
dc.publisherPergamon-Elsevier Ltd
dc.sourceRadiation Measurements
dc.subjectKeywords: Deposition; Etching; Phase transitions; Silica; Ion tracks; Heavy ions Chemical deposition; Etched tracks; Galvanic deposition; Latent tracks; Microtransformers; Swift heavy ions
dc.titleThe Emergence of New Ion Tract Applications
dc.typeJournal article
local.bibliographicCitation.lastpage609
local.bibliographicCitation.startpage605
local.contributor.affiliationFink, Dietmar, Hahn-Meitner-Institut
local.contributor.affiliationAlegaonkar, P S, Hahn-Meitner-Institut
local.contributor.affiliationPetrov, A V, Hahn-Meitner-Institut
local.contributor.affiliationBerdinsky, A.S., Novosibirsk State Technical University
local.contributor.affiliationRao, V., Mangalore University
local.contributor.affiliationMuller, M, University of Cape Town
local.contributor.affiliationDwivedi, K.K., Arunachal University
local.contributor.affiliationChadderton, Lewis, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidChadderton, Lewis, u1809603
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020201 - Atomic and Molecular Physics
local.identifier.ariespublicationMigratedxPub16276
local.identifier.citationvolume36
local.identifier.doi10.1016/S1350-4487(03)00209-9
local.identifier.scopusID2-s2.0-0042864704
local.type.statusPublished Version

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