Melting Kinetics of Confined Systems at the Nanoscale: Superheating and Supercooling
Date
Authors
Sharp, I D
Xu, Q
Yuan, C W
Yi, D O
Liao, C Y
Glaeser, Andreas M
Minor, A M
Beeman, J W
Ridgway, Mark C
Kluth, Patrick
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American Institute of Physics (AIP)
Abstract
In situ electron diffraction measurements of silica-embedded Ge nanocrystals reveal a melting/solidification hysteresis of 470 K which is approximately symmetric about the bulk melting point. This surprising behavior, which is thought to be impossible in
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Proceedings of International Conference on the Physics of Semiconductors (ICPS 2006)