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Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

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Date

2008

Authors

Kluth, Patrick
Schnohr, Claudia
Sprouster, David
Byrne, Aidan
Cookson, D J
Ridgway, Mark C

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier

Abstract

In this paper we present preliminary yet promising results on the measurement of latent ion tracks in amorphous, 2 μm thick SiO2 layers using small angle X-ray scattering (SAXS). The tracks were generated by ion irradiation with 89 MeV Au ions to fluence

Description

Keywords

Keywords: Amorphous materials; Heavy ions; Inelastic neutron scattering; Ion bombardment; Thermal effects; X ray scattering; Cylindrical models; Ion tracks; Swift heavy ion irradiation; Unirradiated materials; Silica Latent tracks; SAXS; SiO2; Swift heavy ion irradiation

Citation

URI

http://hdl.handle.net/1885/36808

Collections

ANU Research Publications

Source

Nuclear Instruments and Methods in Physics Research: Section B

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1016/j.nimb.2008.03.182

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