Determination of selenium concentrations in NIST SMR 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II
Date
2009
Authors
Jenner, Frances
Holden, Peter
Mavrogenes, John
O'Neill, Hugh
Allen, Charlotte M
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Blackwell Publishing Ltd
Abstract
A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g-1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g-1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g-1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g-1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g-1.
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Keywords: BCR-2G; EMPA; LA-ICP-MS; MPI-DING; NIST SRM; Reference materials; Selenium; SHRIMP
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Geostandards and Geoanalytical Research
Type
Journal article
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2037-12-31
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