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Reversibility and stability of ZnO-Sb2Te3 nanocomposite films for phase change memory applications

dc.contributor.authorWang, Guoxiang
dc.contributor.authorChen, Yimin
dc.contributor.authorShen, Xiang
dc.contributor.authorLi, Junjian
dc.contributor.authorWang, Rongping
dc.contributor.authorLu, Yegang
dc.contributor.authorDai, Shixun
dc.contributor.authorXu, Tiefeng
dc.contributor.authorNie, Qiuhua
dc.date.accessioned2015-12-13T22:17:22Z
dc.date.issued2014
dc.date.updated2019-11-25T07:47:21Z
dc.description.abstract(ZnO)x(Sb2Te3)1-x materials with different ZnO contents have been systemically studied with an aim of finding the most suitable composition for phase change memory applications. It was found that ZnO-doping could improve thermal stability and electrical behavior of Sb2Te3 film. Sb2Te3-rich nanocrystals, surrounded by ZnO-rich amorphous phases, were observed in annealed ZnO-doped Sb2Te3 composite films, and the segregated domains exhibited a relatively uniform distribution. The ZnO-doped Sb2Te3 composite films, especially with 5.2 at% ZnO concentration were found to have higher crystallization temperature, higher crystalline resistance, and faster crystallization speed in comparison with Ge2Sb2Te5. A reversible repetitive optical switching behavior can be observed in (ZnO)5.2(Sb2Te 3)94.8, confirming that the ZnO doping is responsible for a fast switching and the compound is stable with cycling. Therefore, it is promising for the applications in phase change memory devices.
dc.identifier.issn1944-8244
dc.identifier.urihttp://hdl.handle.net/1885/71093
dc.publisherAmerican Chemical Society
dc.sourceACS Applied Materials and Interfaces
dc.subjectKeywords: crystallization; nanocomposite; optical reflectivity; phase change; thin films
dc.titleReversibility and stability of ZnO-Sb2Te3 nanocomposite films for phase change memory applications
dc.typeJournal article
local.bibliographicCitation.issue11
local.bibliographicCitation.lastpage8496
local.bibliographicCitation.startpage8488
local.contributor.affiliationWang, Guoxiang, Ningbo University
local.contributor.affiliationChen, Yimin, Ningbo University
local.contributor.affiliationShen, Xiang, Ningbo University
local.contributor.affiliationLi, Junjian, Ningbo University
local.contributor.affiliationWang, Rongping, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLu, Yegang, Ningbo University
local.contributor.affiliationDai, Shixun, Ningbo University
local.contributor.affiliationXu, Tiefeng, Ningbo University
local.contributor.affiliationNie, Qiuhua, Ningbo University
local.contributor.authoruidWang, Rongping, u4219061
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor091200 - MATERIALS ENGINEERING
local.identifier.absfor020400 - CONDENSED MATTER PHYSICS
local.identifier.absfor020500 - OPTICAL PHYSICS
local.identifier.ariespublicationU3488905xPUB2552
local.identifier.citationvolume6
local.identifier.doi10.1021/am501345x
local.identifier.scopusID2-s2.0-84902531991
local.identifier.thomsonID000337336900064
local.type.statusPublished Version

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