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Evaluating plasmonic light trapping with photoluminescence

Date

Authors

Barugkin (Qiaoke), Chog

Wan, Yimao

MacDonald, Daniel

Catchpole, Kylie

Publisher

IEEE Electron Devices Society

Abstract

We use photoluminescence measurements to quantify the light trapping for a range of plasmonic structures. By combining Ag nanoparticles as a scattering structure and diffuse white paint as a back surface reflector (BSR) on silicon wafers, we can achieve a

Keywords

Keywords: Absorption enhancement; Ag nanoparticle; Effective carrier lifetimes; Light-trapping; Measurements of; Passivation layer; Photoluminescence measurements; Scattering structures; Absorption; Electric properties; Nanoparticles; Photoluminescence; Plasmons; S Absorption; nanoparticles; photoluminescence; silicon

URI

http://hdl.handle.net/1885/74890

Collections

ANU Research Publications

Source

IEEE Journal of Photovoltaics

Type

Journal article

DOI

10.1109/JPHOTOV.2013.2273570

Restricted until

2037-12-31

Downloads

File

Description

01_Barugkin (Qiaoke)_Evaluating_plasmonic_light_2013.pdf (2.76 MB)

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