Nanoscale phase separation in ultrafast pulsed laser deposited arsenic trisulfide (As₂S₃) films and its effect on plasma etching
Date
2007-10-23
Authors
Madden, Steve
Rode, Andrei
Wang, Rongping
Luther-Davies, Barry
Choi, Duk-Yong
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American Institute of Physics (AIP)
Abstract
We have observed nanoscale phase separation in amorphous arsenic trisulfide (As₂S₃)films produced by ultrafast pulsed laser deposition and its effect on the surface morphology of the film after plasma etching. When the film was etched in CF₄–O₂plasma, a grainy structure was observed on the surface. From Raman and x-ray photoelectron spectroscopies, we concluded that the grainy structure of the etchedsurfaces comes from the differential chemical attack between different phases in the film.
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Keywords: Arsenic; Chemical attack; Laser pulses; Plasma etching; Surface morphology; Thin films; X ray photoelectron spectroscopy; Amorphous arsenic trisulfide; Etched surfaces; Grainy structure; Phase separation
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Journal of Applied Physics
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