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On optical activity of Er⁺³ ions in Si-rich SiO₂ waveguides

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Minissale, S.
Gregorkiewicz, T.
Forcales, M.
Elliman, R. G.

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American Institute of Physics (AIP)

Abstract

Photoluminescence spectroscopy was used to explore the optical activity of Er³⁺ ions in Si-rich SiO₂waveguides prepared by ion implantation. Measurements were performed for a series of materials characterized by different Si excess levels, Er concentrations, and annealing temperatures. The highest fraction of optically active Er³⁺ ions which can be efficiently activated by nonresonant pumping was found to be 2.6%. This was realized in a waveguide with an Er concentration of [Er]=10¹⁸cm⁻³ and Si excess of 20%, annealed at 900°C. This optical activity level is insufficient to realize optical gain. It is therefore clear that further material improvement is needed before optical amplification in SiO₂:Er matrices sensitized by Si nanocrystals/nanoclusters can be achieved.

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Applied Physics Letters

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