Phase transformations induced in relaxed amorphous silicon by indentation at room temperature
dc.contributor.author | Haberl, Bianca | |
dc.contributor.author | Bradby, J. E. | |
dc.contributor.author | Swain, M. V. | |
dc.contributor.author | Williams, J. S. | |
dc.contributor.author | Munroe, P. | |
dc.date.accessioned | 2015-10-08T04:10:26Z | |
dc.date.available | 2015-10-08T04:10:26Z | |
dc.date.issued | 2004-12-06 | |
dc.date.updated | 2015-12-12T08:16:52Z | |
dc.description.abstract | The deformation behavior of self-ion-implanted amorphous-Si (a-Si) has been studied using spherical nanoindentation in both relaxed (annealed) and unrelaxed (as-implanted) a-Si. Interestingly, phase transformations were clearly observed in the relaxed state, with the load–unload curves from these samples displaying characteristic discontinuities and cross-sectional transmission electron microscopy images indicating the presence of high-pressure crystalline phases Si-III and Si-XII following pressure release. Thus, an amorphous to crystalline phase transformation has been induced by indentation at room temperature. In contrast, no evidence of a phase transformation was observed in unrelaxed a-Si, which appeared to deform via plastic flow of the amorphous phase. Furthermore, in situ electrical measurements clearly indicate the presence of a metallic Si phase during loading of relaxed a-Si but no such behavior was observed for unrelaxed a-Si. | |
dc.identifier.issn | 0003-6951 | en_AU |
dc.identifier.uri | http://hdl.handle.net/1885/15815 | |
dc.publisher | American Institute of Physics | |
dc.rights | http://www.sherpa.ac.uk/romeo/issn/0003-6951..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 8/10/15). Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at https://doi.org/10.1063/1.1832757 | |
dc.source | Applied Physics Letters | |
dc.subject | Keywords: Low-density amorphous phases; Nanoindentation; Room temperature; Unloading rates; Curve fitting; Deformation; High pressure effects; Indentation; Ion implantation; Phase transitions; Plastic flow; Amorphous silicon | |
dc.title | Phase transformations induced in relaxed amorphous silicon by indentation at room temperature | |
dc.type | Journal article | |
local.bibliographicCitation.issue | 23 | en_AU |
local.bibliographicCitation.lastpage | 5561 | |
local.bibliographicCitation.startpage | 5559 | en_AU |
local.contributor.affiliation | Haberl, Bianca, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Bradby, Jodie, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Swain, M V, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Williams, James, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Munroe, Paul, University of New South Wales, Australia | en_AU |
local.contributor.authoremail | jodie.bradby@anu.edu.au | |
local.contributor.authoruid | u4284509 | en_AU |
local.contributor.authoruid | u9908195 | |
local.description.notes | Imported from ARIES | en_AU |
local.description.refereed | Yes | |
local.identifier.absfor | 090699 | en_AU |
local.identifier.ariespublication | MigratedxPub15807 | en_AU |
local.identifier.citationvolume | 85 | en_AU |
local.identifier.doi | 10.1063/1.1832757 | en_AU |
local.identifier.scopusID | 2-s2.0-12844268254 | |
local.identifier.uidSubmittedBy | u3488905 | en_AU |
local.publisher.url | https://www.aip.org/ | en_AU |
local.type.status | Published Version | en_AU |
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