Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials

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dc.contributor.authorVos, Maarten
dc.contributor.authorWinkelmann, A
dc.date.accessioned2021-06-11T03:41:54Z
dc.date.issued2017
dc.date.updated2020-11-23T10:28:34Z
dc.description.abstractAngle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P.en_AU
dc.description.sponsorshipThis work was made possible by a grant of the Australian Research Council.en_AU
dc.format.mimetypeapplication/pdfen_AU
dc.identifier.issn1044-5803en_AU
dc.identifier.urihttp://hdl.handle.net/1885/237298
dc.language.isoen_AUen_AU
dc.provenancehttps://v2.sherpa.ac.uk/id/publication/13700..."The Accepted Version can be archived in an Institutional Repository. 24 Months. CC BY-NC-ND." from SHERPA/RoMEO site (as at 10/06/2021).
dc.publisherElsevieren_AU
dc.rights© 2016 Elsevier Inc.en_AU
dc.rights.licenseCC BY-NC-ND
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.sourceMaterials Characterizationen_AU
dc.subjectElectron backscatter diffractionen_AU
dc.subjectElectrostatic analyseren_AU
dc.subjectNon-centro symmetric crystalsen_AU
dc.subjectElectron Rutherford backscatteringen_AU
dc.subjectGallium phosphideen_AU
dc.titleElement-resolved Kikuchi pattern measurements of non-centrosymmetric materialsen_AU
dc.typeJournal articleen_AU
dcterms.accessRightsOpen Access
local.bibliographicCitation.lastpage339en_AU
local.bibliographicCitation.startpage328en_AU
local.contributor.affiliationVos, Maarten, College of Science, ANUen_AU
local.contributor.affiliationWinkelmann, A, Bruker Nano GmbHen_AU
local.contributor.authoremailu9700295@anu.edu.auen_AU
local.contributor.authoruidVos, Maarten, u9700295en_AU
local.description.notesImported from ARIESen_AU
local.identifier.absfor099999 - Engineering not elsewhere classifieden_AU
local.identifier.ariespublicationa383154xPUB6260en_AU
local.identifier.citationvolume123en_AU
local.identifier.doi10.1016/j.matchar.2016.11.043en_AU
local.identifier.scopusID2-s2.0-85000645624
local.identifier.thomsonID000392678400036
local.identifier.uidSubmittedBya383154en_AU
local.publisher.urlhttps://www.elsevier.com/en-auen_AU
local.type.statusAccepted Versionen_AU

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