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Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements

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Date

2014-02-19

Authors

Hameiri, Ziv
Rougieux, Fiacre
Sinton, Ron
Trupke, Thorsten

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physics (AIP)

Abstract

A contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated.

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Citation

URI

http://hdl.handle.net/1885/16039

Collections

ANU Research Publications

Source

Applied Physics Letters

Type

Journal article

Book Title

Entity type

Access Statement

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DOI

10.1063/1.4865804

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