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Resistance switching in polycrystalline NiOx thin film

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Date

2010

Authors

Kim, Tae-Hyun
Nawaz (Saleh), Muhammad
Kim, Sung-I
Venkatachalam, Dinesh
Belay, Kidane
Burgess, Andrew
Strumpp, Stephan
Elliman, Robert

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers (IEEE Inc)

Abstract

Resistive switching properties of polycrystalline NiOx dielectric films are investigated utilizing thermo-chemical model in which a field-induced conductive filament is formed and broken by joule heating.

Description

Keywords

Keywords: Conductive filaments; Polycrystalline; Resistance switching; Resistive switching; Thermochemical models; Conductive films; Dielectric films; Microelectronics

Citation

URI

http://hdl.handle.net/1885/51745

Collections

ANU Research Publications

Source

2010 conference on Optoelectronic and Microelectronic Materials and Devices Proceedings

Type

Conference paper

Book Title

Entity type

Access Statement

License Rights

DOI

10.1109/COMMAD.2010.5699751

Restricted until

2037-12-31

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01_Kim_Resistance_switching_in_2010.pdf (345.73 KB)

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