Resistance switching in polycrystalline NiOx thin film
Date
Authors
Kim, Tae-Hyun
Nawaz (Saleh), Muhammad
Kim, Sung-I
Venkatachalam, Dinesh
Belay, Kidane
Burgess, Andrew
Strumpp, Stephan
Elliman, Robert
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Institute of Electrical and Electronics Engineers (IEEE Inc)
Abstract
Resistive switching properties of polycrystalline NiOx dielectric films are investigated utilizing thermo-chemical model in which a field-induced conductive filament is formed and broken by joule heating.
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2010 conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
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2037-12-31
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