Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes
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Khalil, A S
Chadderton, Lewis
Stewart, Andrew
Llewellyn, David
Ridgway, Mark C
Byrne, Aidan
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Cambridge University Press
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Microscopy and Microanalysis
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Restricted until
2037-12-31