Colloid Probe Characterization: Radius and Roughness Determination

Date

2001

Authors

Neto, Chiara
Craig, Vincent

Journal Title

Journal ISSN

Volume Title

Publisher

American Chemical Society

Abstract

In the last 10 years the atomic force microscope (AFM) has routinely been applied to the direct measurement of surface forces. A particle is often attached to the tip of the force-sensing cantilever in order to control the chemistry and the geometry of the interaction. Usually a spherical particle (colloid probe) is employed, and the measured interaction force is normalized by the radius, enabling comparisons to be made with both theory and other techniques. Here we report a simple method for characterizing the radius, surface roughness, and regularity of colloid probe particles. The colloid probe is "reverse imaged" by employing a surface with very sharp features. A standard calibration grating is suitable. No further equipment is required. The method is straightforward and will be of value to researchers employing the AFM for force measurement.

Description

Keywords

Keywords: Surface forces; Atomic force microscopy; Imaging techniques; Scanning electron microscopy; Surface reactions; Surface roughness; Colloids

Citation

Source

Langmuir

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1021/la001506y

Restricted until

2037-12-31