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Measuring and Interpreting the Lifetime of Silicaon Wafers

dc.contributor.authorCuevas, Andres
dc.contributor.authorMacDonald, Daniel
dc.coverage.spatialAdelaide Australia
dc.date.accessioned2015-12-13T23:07:15Z
dc.date.available2015-12-13T23:07:15Z
dc.date.createdNovember 25 2001
dc.identifier.isbn0975065009
dc.identifier.urihttp://hdl.handle.net/1885/86125
dc.publisherAustralian and New Zealand Solar Energy Society (ANZSES)
dc.relation.ispartofseriesSolar World Congress 2001
dc.sourceISES 2001 Solar World Congress: Proceedings
dc.titleMeasuring and Interpreting the Lifetime of Silicaon Wafers
dc.typeConference paper
local.description.notesImported from ARIES
local.description.refereedYes
dc.date.issued2003
local.identifier.absfor090699 - Electrical and Electronic Engineering not elsewhere classified
local.identifier.ariespublicationMigratedxPub14891
local.type.statusPublished Version
local.contributor.affiliationCuevas, Andres, College of Engineering and Computer Science, ANU
local.contributor.affiliationMacDonald, Daniel, College of Engineering and Computer Science, ANU
local.bibliographicCitation.startpage1517
local.bibliographicCitation.lastpage1522
dc.date.updated2015-12-12T08:08:28Z
CollectionsANU Research Publications

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