Structural Characterization of Cu Nanocrystals Formed in SiO 2 by High-Energy Ion-Beam Synthesis
Date
2005
Authors
Johannessen, Bernt
Kluth, Patrick
Glover, Christopher
de Azevedo, Gustavo
Llewellyn, David
Foran, Garry J
Ridgway, Mark C
Journal Title
Journal ISSN
Volume Title
Publisher
American Institute of Physics (AIP)
Abstract
Cu nanocrystals (NCs) were produced by multiple high-energy ion implantations into 5-μm -thick amorphous silica (Si O2) at liquid-nitrogen temperature. The Cu-rich Si O2 films were subsequently annealed to reduce irradiation-induced damage and promote NC
Description
Keywords
Keywords: Copper atoms; Structural disorder; X ray absorption fine structure spectroscopy; Amorphous materials; Backscattering; Electron microscopy; Ion beams; Ion implantation; Nanostructured materials; Oxidation; Rutherford backscattering spectroscopy; Silica; Sp
Citation
Collections
Source
Journal of Applied Physics
Type
Journal article