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Structural Characterization of Cu Nanocrystals Formed in SiO 2 by High-Energy Ion-Beam Synthesis

Johannessen, Bernt; Kluth, Patrick; Glover, Christopher; de Azevedo, Gustavo; Llewellyn, David; Foran, Garry J; Ridgway, Mark C

Description

Cu nanocrystals (NCs) were produced by multiple high-energy ion implantations into 5-μm -thick amorphous silica (Si O2) at liquid-nitrogen temperature. The Cu-rich Si O2 films were subsequently annealed to reduce irradiation-induced damage and promote NC

dc.contributor.authorJohannessen, Bernt
dc.contributor.authorKluth, Patrick
dc.contributor.authorGlover, Christopher
dc.contributor.authorde Azevedo, Gustavo
dc.contributor.authorLlewellyn, David
dc.contributor.authorForan, Garry J
dc.contributor.authorRidgway, Mark C
dc.date.accessioned2015-12-13T22:45:58Z
dc.date.available2015-12-13T22:45:58Z
dc.identifier.issn0021-8979
dc.identifier.urihttp://hdl.handle.net/1885/80046
dc.description.abstractCu nanocrystals (NCs) were produced by multiple high-energy ion implantations into 5-μm -thick amorphous silica (Si O2) at liquid-nitrogen temperature. The Cu-rich Si O2 films were subsequently annealed to reduce irradiation-induced damage and promote NC
dc.publisherAmerican Institute of Physics (AIP)
dc.sourceJournal of Applied Physics
dc.subjectKeywords: Copper atoms; Structural disorder; X ray absorption fine structure spectroscopy; Amorphous materials; Backscattering; Electron microscopy; Ion beams; Ion implantation; Nanostructured materials; Oxidation; Rutherford backscattering spectroscopy; Silica; Sp
dc.titleStructural Characterization of Cu Nanocrystals Formed in SiO 2 by High-Energy Ion-Beam Synthesis
dc.typeJournal article
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.citationvolume98
dc.date.issued2005
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.ariespublicationMigratedxPub8383
local.type.statusPublished Version
local.contributor.affiliationJohannessen, Bernt, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationGlover, Christopher, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationde Azevedo, Gustavo, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLlewellyn, David, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationForan, Garry J, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.bibliographicCitation.issue2
local.bibliographicCitation.startpage024307-1-9
local.identifier.doi10.1063/1.1980533
dc.date.updated2015-12-11T10:26:16Z
local.identifier.scopusID2-s2.0-23844544718
CollectionsANU Research Publications

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