Ion-Beam-Produced Structural Defects in ZnO
We study the evolution of lattice defects in single-crystal ZnO bombarded with 60-keV 28Si and 300-keV 197Au ions at 77 and 300 K. To characterize ion-beam-produced structural defects, we use a combination of Rutherford backscattering/channeling (RBS/C) spectrometry, cross-sectional transmission electron microscopy (XTEM), x-ray photoelectron spectroscopy, and atomic force microscopy. Results show that ZnO exhibits strong dynamic annealing, and even high-dose bombardment with heavy (197Au) ions...[Show more]
|Collections||ANU Research Publications|
|Source:||Physical Review B|
|01_Kucheyev_Ion-Beam-Produced_Structural_2003.pdf||299.43 kB||Adobe PDF||Request a copy|
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