Mitchell, Bernhard; MacDonald, Daniel; Schon, J; Weber, Jurgen; Wagner, Hannes; Trupke, Thorsten
The interstitial iron concentration measured directly on the side face of a silicon brick after crystallization and brick squaring can give important early and fast feedback regarding its material quality. Interstitial iron is an important defect in crystalline silicon, particularly in directionally solidified ingots. Spectral photoluminescence intensity ratio imaging has recently been demonstrated to independently provide high-resolution bulk lifetime images and is therefore ideally suited to...[Show more]
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