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Impact of Metal Contamination in Silicon Solar Cells

Coletti, Gianluca; Bronsveld, P C P; Hahn, Giso; Warta, Wilhelm; MacDonald, Daniel; Ceccaroli, Bruno; Wambach, Karsten; Le Quang, Nam Le; Fernandez, Juan M

Description

The impact of the transition metals iron, chromium, nickel, titanium and copper on solar-cell performance is investigated. Each impurity is intentionally added to the silicon feedstock used to grow p-type, directionally solidified, multicrystalline silicon ingots. A state-of-the-art screen-print solar-cell process is applied to this material. Impurities like iron, chromium and titanium cause a reduction in the diffusion length. Nickel does not reduce the diffusion length significantly, but...[Show more]

dc.contributor.authorColetti, Gianluca
dc.contributor.authorBronsveld, P C P
dc.contributor.authorHahn, Giso
dc.contributor.authorWarta, Wilhelm
dc.contributor.authorMacDonald, Daniel
dc.contributor.authorCeccaroli, Bruno
dc.contributor.authorWambach, Karsten
dc.contributor.authorLe Quang, Nam Le
dc.contributor.authorFernandez, Juan M
dc.date.accessioned2015-12-10T23:25:04Z
dc.identifier.issn1616-3028
dc.identifier.urihttp://hdl.handle.net/1885/67472
dc.description.abstractThe impact of the transition metals iron, chromium, nickel, titanium and copper on solar-cell performance is investigated. Each impurity is intentionally added to the silicon feedstock used to grow p-type, directionally solidified, multicrystalline silicon ingots. A state-of-the-art screen-print solar-cell process is applied to this material. Impurities like iron, chromium and titanium cause a reduction in the diffusion length. Nickel does not reduce the diffusion length significantly, but strongly affects the emitter recombination, reducing the solar-cell performance significantly. Copper has the peculiarity of impacting both base-bulk recombination as well as emitter recombination. Two models based on the Scheil distribution of impurities are derived to fit the degradation along the ingot. Solar-cell performances are modelled as a function of base-bulk recombination and emitter-bulk recombination. The model fits the experimental data very well and is also successfully validated. Unexpectedly, the distribution of impurities along the ingot, due to segregation phenomena (Scheil distribution), leaves its finger-print even at the end of the solar-cell process. A measure of impurity impact is defined as the level of impurity that causes a degradation in cell performance of less than 2% up to 90% of the ingot height. The advantage of this impurity-impact metric is that it comprises the different impurities physical characters in one single parameter, which is easy to compare.
dc.publisherWiley-VCH Verlag GMBH
dc.sourceAdvanced Functional Materials
dc.subjectKeywords: Bulk recombination; Cell performance; Cell process; Diffusion length; Directionally solidified; Experimental data; In-cell; Metal contamination; Model fit; Multi-crystalline silicon; P-type; Segregation phenomena; Silicon feedstocks; Single parameter; Chr contaminations; feedstock; impurities; silicon; solar cells
dc.titleImpact of Metal Contamination in Silicon Solar Cells
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume21
dc.date.issued2011
local.identifier.absfor120499 - Engineering Design not elsewhere classified
local.identifier.ariespublicationf2965xPUB1462
local.type.statusPublished Version
local.contributor.affiliationColetti, Gianluca, Energy Research Centre of the Netherlands
local.contributor.affiliationBronsveld, P C P, ECN Solar Energy
local.contributor.affiliationHahn, Giso, University of Konstanz
local.contributor.affiliationWarta, Wilhelm, Fraunhofer Institute
local.contributor.affiliationMacDonald, Daniel, College of Engineering and Computer Science, ANU
local.contributor.affiliationCeccaroli, Bruno, Marche AS
local.contributor.affiliationWambach, Karsten, Sunicon AG
local.contributor.affiliationLe Quang, Nam Le, PhotoWatt International S. A.
local.contributor.affiliationFernandez, Juan M, BP Solar
local.description.embargo2037-12-31
local.bibliographicCitation.issue5
local.bibliographicCitation.startpage879
local.bibliographicCitation.lastpage890
local.identifier.doi10.1002/adfm.201000849
dc.date.updated2016-02-24T08:14:02Z
local.identifier.scopusID2-s2.0-79952166537
local.identifier.thomsonID000288028400007
CollectionsANU Research Publications

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