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Fabrication and resistance-switching behaviors of NiO thin films by thermal oxidation of evaporated Ni films

Cao, Xun; Li, Xiaomin; Yu, Weidong; Yang, Rui; Liu, Xinjun

Description

Polycrystalline NiO thin films were fabricated on Pt (111)/Ti/SiO2/Si substrates by thermal oxidation of the evaporated Ni films. Pt/NiO/Pt structures were prepared, and they showed reversible resistance switching behaviors. When the compliance set current was varied from 5 mA to 40 mA, the on-state currents increased, while the on-state resistances decreased. It is probably attributed to higher current compliance resulted in the formation of stronger and less resistive filaments, which in turn...[Show more]

CollectionsANU Research Publications
Date published: 2009
Type: Journal article
URI: http://hdl.handle.net/1885/65979
Source: Advanced Materials Research
DOI: 10.4028/www.scientific.net/AMR.66.131

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