Electron-pinned defect-dipoles for high-performance colossal permittivity materials
Date
2013
Authors
Hu, Wanbiao
Liu, Yun
Withers, Raymond
Frankcombe, Terry
Noren, Lasse
Snashall, Amanda
Kitchin, Melanie
Smith, Paul
Gong, Bill
Chen, Hua
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Nature Publishing Group
Abstract
The immense potential of colossal permittivity (CP) materials for use in modern microelectronics as well as for high-energy-density storage applications has propelled much recent research and development. Despite the discovery of several new classes of CP
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Keywords
Keywords: Broad temperature ranges; Colossal permittivity; Defect engineering; High energy densities; Localized electrons; Low dielectric loss; Modern microelectronics; Systematic defect analysis; Dielectric losses; Materials; Microelectronics; Niobium compounds; O
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Nature Materials
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Journal article
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2037-12-31
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