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On the Composition of the Top Layer of Microphase Separated Thin PS-PEO Films

Neto, Chiara; James, Michael; Telford, Andrew M

Description

The topography and surface composition of thin films (ca. 100 nm) of a polystyrene-b-poly(ethylene oxide) (PS-PEO) block copolymer are investigated using a suite of complementary techniques, namely tapping mode atomic force microscopy (AFM), optical microscopy, X-ray photoelectron spectroscopy (XPS), neutron reflectometry, and wettability measurements. The copolymer films separate into lamellar structures oriented parallel to the silicon substrate, and bicontinuous and island/hole morphologies...[Show more]

dc.contributor.authorNeto, Chiara
dc.contributor.authorJames, Michael
dc.contributor.authorTelford, Andrew M
dc.date.accessioned2015-12-10T22:25:15Z
dc.identifier.issn0024-9297
dc.identifier.urihttp://hdl.handle.net/1885/53395
dc.description.abstractThe topography and surface composition of thin films (ca. 100 nm) of a polystyrene-b-poly(ethylene oxide) (PS-PEO) block copolymer are investigated using a suite of complementary techniques, namely tapping mode atomic force microscopy (AFM), optical microscopy, X-ray photoelectron spectroscopy (XPS), neutron reflectometry, and wettability measurements. The copolymer films separate into lamellar structures oriented parallel to the silicon substrate, and bicontinuous and island/hole morphologies characteristic of this arrangement appear. Even though the crystalline topography of the film's surface and its wettability properties suggest the presence of PEO on the top surface, XPS and neutron reflectometry data point undoubtedly to the presence of a top layer of PS at the air/film interface. Tapping mode AFM images unequivocally demonstrate that in air only one block is present at the air/film interface. Neutron reflectometry data identify the nature of each phase-separated layer within the film. This finding differs from a model of domain arrangement proposed in a classic and much-cited paper on these systems (Macromolecules 1979, 12, 323). After exposure to water, PEO blocks rearrange and access the top surface of the film. After many hours of thermal annealing, both PS and PEO blocks can be made to appear at the film/air interface, within isolated droplets formed upon film dewetting.
dc.publisherAmerican Chemical Society
dc.sourceMacromolecules
dc.subjectKeywords: AFM image; Air/film interfaces; Bicontinuous; Cited papers; Copolymer films; Data points; De-wetting; Microphase separated; Neutron reflectometry; Separated layer; Silicon substrates; Surface compositions; Tapping modes; Tapping-mode atomic force microsco
dc.titleOn the Composition of the Top Layer of Microphase Separated Thin PS-PEO Films
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume42
dc.date.issued2009
local.identifier.absfor030603 - Colloid and Surface Chemistry
local.identifier.ariespublicationu9210271xPUB272
local.type.statusPublished Version
local.contributor.affiliationNeto, Chiara, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJames, Michael, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationTelford, Andrew M, University of Sydney
local.description.embargo2037-12-31
local.bibliographicCitation.issue13
local.bibliographicCitation.startpage4801
local.bibliographicCitation.lastpage4808
local.identifier.doi10.1021/ma900690e
dc.date.updated2016-02-24T11:55:28Z
local.identifier.scopusID2-s2.0-67650446400
CollectionsANU Research Publications

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