Neto, Chiara; James, Michael; Telford, Andrew M
The topography and surface composition of thin films (ca. 100 nm) of a polystyrene-b-poly(ethylene oxide) (PS-PEO) block copolymer are investigated using a suite of complementary techniques, namely tapping mode atomic force microscopy (AFM), optical microscopy, X-ray photoelectron spectroscopy (XPS), neutron reflectometry, and wettability measurements. The copolymer films separate into lamellar structures oriented parallel to the silicon substrate, and bicontinuous and island/hole morphologies...[Show more]
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