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Determination of selenium concentrations in NIST SMR 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

Jenner, Frances; Holden, Peter; Mavrogenes, John; O'Neill, Hugh; Allen, Charlotte M


A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g-1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g-1. The concentration of Se in NIST SRM...[Show more]

CollectionsANU Research Publications
Date published: 2009
Type: Journal article
Source: Geostandards and Geoanalytical Research
DOI: 10.1111/j.1751-908X.2009.00024.x


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