Light and elevated temperature induced degradation in p-type and n-type cast-grown multicrystalline and mono-like silicon

Date

2018

Authors

Sio, Hang Cheong (Kelvin)
Wang, Haitao
Wang, Quanzhi
Sun, Ryan
Chen, Wei
Jin, Hao
Macdonald, Daniel

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier

Abstract

We compare light induced degradation behaviours in lifetime samples and fully fabricated solar cells made from p-type boron-doped high performance multicrystalline silicon, p-type boron-doped mono-like silicon, n-type phosphorus-doped high performance multicrystalline silicon and p-type boron-doped Czochralski-grown silicon. Our results confirm that the degradation in multicrystalline silicon is triggered by the rapid cooling after the firing process. All cast-grown silicon samples subjected to fast cooling show lifetime reduction after light soaking. Interestingly, the degradation rate in n-type multicrystalline silicon is found to be orders of magnitude slower than in p-type multicrystalline silicon, suggesting that the defect formation mechanism could be affected by the positions of the quasi fermi levels.

Description

Keywords

LID, LeTID, Degradation, Regeneration, Multicrystalline silicon, Mono-like silicon

Citation

Source

Solar Energy Materials and Solar Cells

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

Restricted until

2099-12-31