Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN
Date
2018
Authors
Praena, J
Ferrer, F J
Vollenberg, W
Sabaté-Gilarte, M
Fernández, B
García-López, J
Porras, I
Quesada, J.M.
Altstadt, S
Andrzejewski, J.
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
Thin S-33 samples for the study of the S-33(n,alpha)Si-30 cross-section at the n_TOF facility at CERN were made by thermal evaporation of S-33 powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of S-33 has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Description
Keywords
Citation
Collections
Source
Nuclear Instruments and Methods in Physics Research: Section A
Type
Journal article
Book Title
Entity type
Access Statement
Open Access
License Rights
CC BY license
Restricted until
2037-12-31
Downloads
File
Description