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A Contactless Method for Determining the Carrier Mobility Sum in Silicon Wafers

Rougieux, Fiacre; Zheng, Peiting; Thiboust, Matthieu; Tan, Jason; Grant, Nicholas; MacDonald, Daniel; Cuevas, Andres

Description

In this paper, we present a new method to determine the simultaneous injection and temperature dependence of the sum of the majority and minority carrier mobilities in silicon wafers. The technique is based on combining transient and quasi-steady-state photoconductance measurements. It does not require a full device structure or contacting but only adequate surface passivation. The mobility dependence on both carrier injection level and temperature, as measured on several test samples, is...[Show more]

CollectionsANU Research Publications
Date published: 2012
Type: Journal article
URI: http://hdl.handle.net/1885/17809
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2011.2175705

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