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Simultaneous fitting of X-ray and neutron diffuse scattering data

Goossens, Darren; Welberry, Thomas; Heerdegen, Aidan; Gutmann, M J


Conventional crystallographic refinement uses the Bragg-peak intensities and gives the single-site average crystal structure. Information about short-range order and local order is contained in the diffuse scattering that is distributed throughout reciprocal space. Models of the short-range order in materials can now be automatically refined. The complementarity of X-ray and neutron diffraction data, and the value of simultaneously refining a structural model against both types of data, has...[Show more]

CollectionsANU Research Publications
Date published: 2007
Type: Journal article
Source: Acta Crystallographica Section A: Foundations of Crystallography
DOI: 10.1107/S0108767306046976


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