Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Physics-based simulation models for EBSD: Advances and challenges

Simple item page
dc.contributor.authorWinkelmann, A.en
dc.contributor.authorNolze, G.en
dc.contributor.authorVos, M.en
dc.contributor.authorSalvat-Pujol, F.en
dc.contributor.authorWerner, W. S.M.en
dc.date.accessioned2025-06-05T19:33:03Z
dc.date.available2025-06-05T19:33:03Z
dc.date.issued2016-02-09en
dc.description.abstractEBSD has evolved into an effective tool for microstructure investigations in the scanning electron microscope. The purpose of this contribution is to give an overview of various simulation approaches for EBSD Kikuchi patterns and to discuss some of the underlying physical mechanisms.en
dc.description.statusPeer-revieweden
dc.identifier.issn1757-8981en
dc.identifier.otherORCID:/0000-0003-2668-9216/work/163315008en
dc.identifier.scopus84964762555en
dc.identifier.urihttp://www.scopus.com/inward/record.url?scp=84964762555&partnerID=8YFLogxKen
dc.identifier.urihttps://hdl.handle.net/1885/733757820
dc.language.isoenen
dc.relation.ispartofseries14th European Workshop on Modern Developments and Applications in Microbeam Analysis, EMAS 2015en
dc.rightsPublisher Copyright: © Published under licence by IOP Publishing Ltd.en
dc.sourceIOP Conference Series: Materials Science and Engineeringen
dc.titlePhysics-based simulation models for EBSD: Advances and challengesen
dc.typeConference paperen
dspace.entity.typePublicationen
local.contributor.affiliationWinkelmann, A.; Bruker Corporationen
local.contributor.affiliationNolze, G.; Federal Institute for Materials Research and Testing Berlinen
local.contributor.affiliationVos, M.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationSalvat-Pujol, F.; TU Wienen
local.contributor.affiliationWerner, W. S.M.; TU Wienen
local.identifier.ariespublicationU3488905xPUB18628en
local.identifier.citationvolume109en
local.identifier.doi10.1088/1757-899X/109/1/012018en
local.identifier.pure088a1e2e-9fc6-4955-8adf-6a80f2c55178en
local.identifier.urlhttps://www.scopus.com/pages/publications/84964762555en
local.type.statusPublisheden

Downloads

Collections

ANU Research Publications

DSpace software copyright © 2002-2026 LYRASIS