Simultaneous quantum state and detector tomography through multiple Hamiltonians

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Xiao, Shuixin
Liang, Weichao
Wang, Yuanlong
Dong, Daoyi
Petersen, Ian R.
Ugrinovskii, Valery

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Institute of Electrical and Electronics Engineers Inc.

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The estimation of all the parameters in an unknown quantum state/measurement device, commonly referred to as quantum state/detector tomography (QST/QDT), plays a pivotal role in characterization and control of quantum systems. In this paper, we introduce a novel method to concurrently identify a quantum state and a detector using multiple Hamiltonians. We then develop two solutions, i.e., a closed-form algorithm and the sum of squares (SOS) optimization. The numerical examples demonstrate that the closed-form solution offers computational efficiency, while the SOS optimization method ensures accuracy.

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2024 IEEE 63rd Conference on Decision and Control, CDC 2024

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