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Asymptotically optimal inspection planning using systems with differential constraints

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dc.contributor.authorPapadopoulos, Georgiosen
dc.contributor.authorKurniawati, Hannaen
dc.contributor.authorPatrikalakis, Nicholas M.en
dc.date.accessioned2026-03-20T14:41:32Z
dc.date.available2026-03-20T14:41:32Z
dc.date.issued2013en
dc.description.statusPeer-revieweden
dc.format.extent8en
dc.identifier.otherBibtex:DBLP:conf/icra/PapadopoulosKP13en
dc.identifier.scopus84887283882en
dc.identifier.urihttps://hdl.handle.net/1885/733807515
dc.language.isoenen
dc.publisherIEEEen
dc.relation.ispartof2013 IEEE International Conference on Robotics and Automation, Karlsruhe, Germany, May 6-10, 2013en
dc.titleAsymptotically optimal inspection planning using systems with differential constraintsen
dc.typeConference paperen
dspace.entity.typePublicationen
local.bibliographicCitation.lastpage4133en
local.bibliographicCitation.startpage4126en
local.contributor.affiliationPapadopoulos, Georgios; Massachusetts Institute of Technologyen
local.contributor.affiliationKurniawati, Hanna; University of Queenslanden
local.contributor.affiliationPatrikalakis, Nicholas M.; Massachusetts Institute of Technologyen
local.identifier.doi10.1109/ICRA.2013.6631159en
local.identifier.purefcd0e50f-da24-45d1-99a1-54b538afac4fen
local.type.statusPublisheden

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