Low-Temperature Synthesis of Graphene by ICP-Assisted Amorphous Carbon Sputtering

dc.contributor.authorYe, Xingen
dc.contributor.authorZhou, Haipingen
dc.contributor.authorLevchenko, Igoren
dc.contributor.authorBazaka, Katerynaen
dc.contributor.authorXu, Shuyanen
dc.contributor.authorXiao, Shaoqingen
dc.date.accessioned2026-01-01T15:41:42Z
dc.date.available2026-01-01T15:41:42Z
dc.date.issued2018-08-14en
dc.description.abstractEfficient and affordable synthesis of graphene at low temperatures remains a significant challenge that potentially limits the use of this material in real-life applications. We describe here a simple, efficient, highly controllable technique to synthesize graphene by sputtering carbon from a solid source with the assistance of inductively coupled plasma (ICP), followed by controllable low-temperature annealing at about 550 oC. Raman scattering and X-ray diffraction characterizations have revealed the formation of a few layer graphene of high quality, confirmed by a low (∼0.48) ID/IG ratio. Raman analysis of samples formed at various annealing temperatures has revealed an upper limit for annealing temperature of 585 oC, beyond which the formed graphene reversibly dissolves in the metal. The ICP-assisted process was innovatively employed to improve the quality of thus-fabricated graphene at low temperatures. The mechanism of graphene formation was attributed to the metal induced graphitization in combination with the carbon precipitation onto the catalyst surface.en
dc.description.statusPeer-revieweden
dc.format.extent7en
dc.identifier.scopus85051697284en
dc.identifier.urihttps://hdl.handle.net/1885/733801293
dc.language.isoenen
dc.rightsPublisher Copyright: © 2018 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheimen
dc.sourceChemistrySelecten
dc.subjectGrapheneen
dc.subjectlow temperatureen
dc.subjectplasmaen
dc.subjectRamanen
dc.subjectsolid carbonen
dc.titleLow-Temperature Synthesis of Graphene by ICP-Assisted Amorphous Carbon Sputteringen
dc.typeJournal articleen
dspace.entity.typePublicationen
local.bibliographicCitation.lastpage8785en
local.bibliographicCitation.startpage8779en
local.contributor.affiliationYe, Xing; University of Electronic Science and Technology of Chinaen
local.contributor.affiliationZhou, Haiping; University of Electronic Science and Technology of Chinaen
local.contributor.affiliationLevchenko, Igor; Nanyang Technological Universityen
local.contributor.affiliationBazaka, Kateryna; Queensland University of Technologyen
local.contributor.affiliationXu, Shuyan; Nanyang Technological Universityen
local.contributor.affiliationXiao, Shaoqing; Jiangnan Universityen
local.identifier.citationvolume3en
local.identifier.doi10.1002/slct.201800911en
local.identifier.pure008c3b73-bb9b-4747-bf49-a0cdebabe342en
local.identifier.urlhttps://www.scopus.com/pages/publications/85051697284en
local.type.statusPublisheden

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