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Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions

dc.contributor.authorSenden, Tim J.en
dc.contributor.authorDrummond, Calum J.en
dc.contributor.authorKékicheff, Patricken
dc.date.accessioned2026-01-05T08:42:12Z
dc.date.available2026-01-05T08:42:12Z
dc.date.issued1994-02-01en
dc.description.abstractThe relationship between atomic force microscope (AFM) surface images and tip-sample surface forces in aqueous electrolyte solutions is examined. Two novel AFM imaging modes, designated as electrical double layer and “hydration”, are compared with the conventional Born “contact” mode of imaging. Fourier analysis suggests that AFM images may reveal correlation lengths and order parameters characteristic of surface forces.en
dc.description.statusPeer-revieweden
dc.format.extent5en
dc.identifier.issn0743-7463en
dc.identifier.otherORCID:/0000-0001-6808-7219/work/171154440en
dc.identifier.scopus0028378151en
dc.identifier.urihttps://hdl.handle.net/1885/733803655
dc.language.isoenen
dc.sourceLangmuiren
dc.titleAtomic Force Microscopy: Imaging with Electrical Double Layer Interactionsen
dc.typeJournal articleen
dspace.entity.typePublicationen
local.bibliographicCitation.lastpage362en
local.bibliographicCitation.startpage358en
local.contributor.affiliationSenden, Tim J.; School Administrative Support, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationDrummond, Calum J.; Australian National Universityen
local.contributor.affiliationKékicheff, Patrick; Australian National Universityen
local.identifier.citationvolume10en
local.identifier.doi10.1021/la00014a004en
local.identifier.pure8d50b7ec-2d1b-427f-83b8-a74423d777a8en
local.identifier.urlhttps://www.scopus.com/pages/publications/0028378151en
local.type.statusPublisheden

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