Excited state lifetime measurements in rare earth nuclei with fast electronics

dc.contributor.authorWerner, V.en
dc.contributor.authorCooper, N.en
dc.contributor.authorBonett-Matiz, M.en
dc.contributor.authorWilliams, E.en
dc.contributor.authorRégis, J. M.en
dc.contributor.authorRudigier, M.en
dc.contributor.authorAhn, T.en
dc.contributor.authorAnagnostatou, V.en
dc.contributor.authorBerant, Z.en
dc.contributor.authorBunce, M.en
dc.contributor.authorElvers, M.en
dc.contributor.authorHeinz, A.en
dc.contributor.authorIlie, G.en
dc.contributor.authorJolie, J.en
dc.contributor.authorRadeck, D.en
dc.contributor.authorSavran, D.en
dc.contributor.authorSmith, M.en
dc.date.accessioned2026-01-01T08:41:38Z
dc.date.available2026-01-01T08:41:38Z
dc.date.issued2011en
dc.description.abstractWe investigated the collectivity of the lowest excited 2+ states of even-even rare earth nuclei. The B(E2) excitation strengths of these nuclei should directly correlate to the size of the valence space, and maximize at mid-shell. The previously identified saturation of B(E2) strength in well-deformed rotors at mid-shell is put to a high precision test in this series of measurements. Lifetimes of the 2+1 states in 168Hf and 174W have been measured using the newly developed LaBr3 scintillation detectors. The excellent energy resolution in conjunction with superb time properties of the new material allows for reliable handling of background, which is a source of systematic error in such experiments. Preliminary lifetime values are obtained and discussed in the context of previous and ongoing work.en
dc.description.statusPeer-revieweden
dc.identifier.issn1742-6588en
dc.identifier.otherORCID:/0000-0002-7895-458X/work/161834928en
dc.identifier.scopus80455127032en
dc.identifier.urihttps://hdl.handle.net/1885/733799152
dc.language.isoenen
dc.relation.ispartofseriesInternational Nuclear Physics Conference 2010, INPC2010en
dc.sourceJournal of Physics: Conference Seriesen
dc.titleExcited state lifetime measurements in rare earth nuclei with fast electronicsen
dc.typeConference paperen
dspace.entity.typePublicationen
local.contributor.affiliationWerner, V.; Yale Universityen
local.contributor.affiliationCooper, N.; Yale Universityen
local.contributor.affiliationBonett-Matiz, M.; Yale Universityen
local.contributor.affiliationWilliams, E.; Yale Universityen
local.contributor.affiliationRégis, J. M.; University of Cologneen
local.contributor.affiliationRudigier, M.; University of Cologneen
local.contributor.affiliationAhn, T.; Yale Universityen
local.contributor.affiliationAnagnostatou, V.; Yale Universityen
local.contributor.affiliationBerant, Z.; Yale Universityen
local.contributor.affiliationBunce, M.; Yale Universityen
local.contributor.affiliationElvers, M.; Yale Universityen
local.contributor.affiliationHeinz, A.; Yale Universityen
local.contributor.affiliationIlie, G.; Yale Universityen
local.contributor.affiliationJolie, J.; University of Cologneen
local.contributor.affiliationRadeck, D.; Yale Universityen
local.contributor.affiliationSavran, D.; Yale Universityen
local.contributor.affiliationSmith, M.; Yale Universityen
local.identifier.ariespublicationu4155331xPUB575en
local.identifier.citationvolume312en
local.identifier.doi10.1088/1742-6596/312/9/092062en
local.identifier.pure8b404df5-4346-43ed-bdfc-c3e7acdb494ben
local.identifier.urlhttps://www.scopus.com/pages/publications/80455127032en
local.type.statusPublisheden

Downloads