SAXS study on the morphology of etched and un-etched ion tracks in apatite

dc.contributor.authorNadzri, A.en
dc.contributor.authorSchauries, D.en
dc.contributor.authorAfra, B.en
dc.contributor.authorRodriguez, M. D.en
dc.contributor.authorMota-Santiago, P.en
dc.contributor.authorMuradoglu, S.en
dc.contributor.authorHawley, A.en
dc.contributor.authorKluth, P.en
dc.date.accessioned2026-01-01T08:42:52Z
dc.date.available2026-01-01T08:42:52Z
dc.date.issued2015-04-06en
dc.description.abstractNatural apatite samples were irradiated with 185 MeV Au and 2.3 GeV Bi ions to simulate fission tracks. The resulting track morphology was investigated using synchrotron small angle x-ray scattering (SAXS) measurements before and after chemical etching. We present preliminary results from the SAXS measurement showing the etching process is highly anisotropic yielding faceted etch pits with a 6-fold symmetry. The measurements are a first step in gaining new insights into the correlation between etched and unetched fission tracks and the use of SAXS as a tool for studying etched tracks.en
dc.description.statusPeer-revieweden
dc.identifier.issn2101-6275en
dc.identifier.otherORCID:/0000-0002-1806-2432/work/161047298en
dc.identifier.scopus84927645349en
dc.identifier.urihttps://hdl.handle.net/1885/733799374
dc.language.isoenen
dc.relation.ispartofseriesHeavy-Ion Accelerator Symposium, HIAS 2014en
dc.rightsPublisher Copyright: © Owned by the authors, published by EDP Sciences, 2015.en
dc.sourceEPJ Web of Conferencesen
dc.titleSAXS study on the morphology of etched and un-etched ion tracks in apatiteen
dc.typeConference paperen
dspace.entity.typePublicationen
local.contributor.affiliationNadzri, A.; Atomic and Molecular Physics Research, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationSchauries, D.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationAfra, B.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationRodriguez, M. D.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationMota-Santiago, P.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationMuradoglu, S.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationHawley, A.; Australian Synchrotronen
local.contributor.affiliationKluth, P.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.identifier.ariespublicationa383154xPUB2551en
local.identifier.citationvolume91en
local.identifier.doi10.1051/epjconf/20159100009en
local.identifier.pureb92d08c7-a310-4647-b11b-3eb549c71afcen
local.identifier.urlhttps://www.scopus.com/pages/publications/84927645349en
local.type.statusPublisheden

Downloads