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Reflectance measurements of triangular lattice GaAs nanowire arrays

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dc.contributor.authorKakko, Joona Pekkoen
dc.contributor.authorHaggrén, Tuomasen
dc.contributor.authorHuhtio, Teppoen
dc.contributor.authorDhaka, Veeren
dc.contributor.authorLipsanen, Harrien
dc.date.accessioned2026-07-03T23:40:40Z
dc.date.available2026-07-03T23:40:40Z
dc.date.issued2014-11-26en
dc.description.abstractTriangular lattice GaAs nanowires were fabricated using electron beam lithography defined Au arrays and metalorganic vapour phase epitaxy. Reflectance measurements for GaAs NW arrays with varying pitch in a triangular lattice are presented. The measured spectra are compared to the literature data on square lattice NW arrays and selective-area epitaxy grown triangular lattice NW arrays. Reflectance from a triangular lattice NW array is found to have similar characteristics as from a square lattice. Unlike for the square lattice, it is observed that the reflection edge does not depend linearly on the NW diameter with smallest pitches in the triangular lattice and that a Morse potential fit describes the behaviour most closely.en
dc.description.statusPeer-revieweden
dc.format.extent5en
dc.identifier.isbn9781479956227en
dc.identifier.otherORCID:/0000-0001-6033-7391/work/219180003en
dc.identifier.scopus84919478795en
dc.identifier.urihttps://hdl.handle.net/1885/733812808
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en
dc.relation.ispartofProceedings of the IEEE Conference on Nanotechnologyen
dc.relation.ispartofseries2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014en
dc.relation.ispartofseriesProceedings of the IEEE Conference on Nanotechnologyen
dc.rightsPublisher Copyright: © 2014 IEEE.en
dc.titleReflectance measurements of triangular lattice GaAs nanowire arraysen
dc.typeConference paperen
dspace.entity.typePublicationen
local.bibliographicCitation.lastpage814en
local.bibliographicCitation.startpage810en
local.contributor.affiliationKakko, Joona Pekko; Aalto Universityen
local.contributor.affiliationHaggrén, Tuomas; Department of Micro- and Nanosciencesen
local.contributor.affiliationHuhtio, Teppo; Aalto Universityen
local.contributor.affiliationDhaka, Veer; Aalto Universityen
local.contributor.affiliationLipsanen, Harri; Aalto Universityen
local.identifier.doi10.1109/NANO.2014.6968093en
local.identifier.essn1944-9399en
local.identifier.pure2705ef06-dd4a-4d1d-a391-b8591d44d012en
local.identifier.urlhttps://www.scopus.com/pages/publications/84919478795en
local.type.statusPublisheden

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