Transfer function sensitivity for discrete and integrated circuits
| dc.contributor.author | Newcomb, R. W. | en |
| dc.contributor.author | Anderson, B. D.O. | en |
| dc.date.accessioned | 2026-01-02T21:41:33Z | |
| dc.date.available | 2026-01-02T21:41:33Z | |
| dc.date.issued | 1970 | en |
| dc.description.abstract | Structures consisting of uniform types of resistive and dielectric materials for the realization of tarnsfer functions are investigated. It is shown through the use of dimensional analysis that the transfer function sensitivity depends only upon the transfer function and not upon the realization configuration. An interpretation through the Bode plot shows that sharp cut-off leads to high sensitivity. | en |
| dc.description.sponsorship | * This work was supported in part by the Joint Services Program under contract number 225(83), the Australian Research Grants Committee, the Australian-American Educational Foundation and the United States Air Force Office of Scientific Research under contract F44620-68-C-0023. 1" Formerly with Stanford University, Stanford, California. Much of the material included was developed whilst the author was a Visiting Faculty Member of the Institute of Technology, Southern Methodist University, Dallas, Texas. | en |
| dc.description.status | Peer-reviewed | en |
| dc.format.extent | 4 | en |
| dc.identifier.issn | 0026-2714 | en |
| dc.identifier.other | ORCID:/0000-0002-1493-4774/work/174739968 | en |
| dc.identifier.scopus | 49849110794 | en |
| dc.identifier.uri | https://hdl.handle.net/1885/733803146 | |
| dc.language.iso | en | en |
| dc.source | Microelectronics Reliability | en |
| dc.title | Transfer function sensitivity for discrete and integrated circuits | en |
| dc.type | Journal article | en |
| dspace.entity.type | Publication | en |
| local.bibliographicCitation.lastpage | 344 | en |
| local.bibliographicCitation.startpage | 341 | en |
| local.contributor.affiliation | Newcomb, R. W.; University of Newcastle | en |
| local.contributor.affiliation | Anderson, B. D.O.; University of Maryland, College Park | en |
| local.identifier.citationvolume | 9 | en |
| local.identifier.doi | 10.1016/0026-2714(70)90554-8 | en |
| local.identifier.pure | ef281ab0-5720-4afc-8adf-5f29216239b3 | en |
| local.identifier.url | https://www.scopus.com/pages/publications/49849110794 | en |
| local.type.status | Published | en |