Film stress in silicon dioxide deposited by helicon activated reactive evaporation
| dc.contributor.author | Au, Vicky | |
| dc.date.accessioned | 2018-11-22T00:08:46Z | |
| dc.date.available | 2018-11-22T00:08:46Z | |
| dc.date.copyright | 2005 | |
| dc.date.issued | 2005 | |
| dc.date.updated | 2018-11-21T11:53:44Z | |
| dc.format.extent | xviii, 166 p. | |
| dc.identifier.other | b2278362 | |
| dc.identifier.uri | http://hdl.handle.net/1885/151642 | |
| dc.language.iso | en_AU | en_AU |
| dc.rights | Author retains copyright | en_AU |
| dc.subject.lcc | QC611.8.A5A9 2005 | |
| dc.subject.lcsh | Silica | |
| dc.subject.lcsh | Amorphous substances | |
| dc.subject.lcsh | Thin films | |
| dc.subject.lcsh | Plasma-enhanced chemical vapor deposition | |
| dc.title | Film stress in silicon dioxide deposited by helicon activated reactive evaporation | |
| dc.type | Thesis (PhD) | en_AU |
| dcterms.accessRights | Open Access | en_AU |
| local.description.notes | Thesis (Ph.D.)--Australian National University, 2005 | en_AU |
| local.identifier.doi | 10.25911/5d515310b4144 | |
| local.mintdoi | mint | |
| local.type.status | Accepted Version | en_AU |
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