Ion-beam processing of GexSi1-x strained-layers

Date

1999

Authors

Glasko, John Michael

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Abstract

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URI

http://hdl.handle.net/1885/147974

Collections

Open Access Theses

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Type

Thesis (PhD)

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DOI

10.25911/5d650f3b72fc0

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b20466766-Glasko_J.pdf (314.21 MB)

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